National Instruments and Tektronix Inc. are offering the Measurement and Analysis Techniques for Embedded System Design Engineers Seminar.

The free half-day technical event is intended to help engineers increase efficiency in their embedded system design processes.

Held from March 2 through May 18 in 11 cities, the seminar focuses on time-saving techniques for measurement and analysis and illustrates how integrating tools such as Tektronix oscilloscopes with NI LabView graphical system design software can significantly enhance design efficiency and accuracy.

Experts from both companies will provide details on how to efficiently test and verify their designs through precise serial bus decode measurements, instrument control, timing and power analysis and report generation.