The selected test methods must be efficient, focusing on validating functionality of the device under test (DUT) while gathering parametric data to help improve the manufacturing process. Also, instrument selection must consider both speed and measurement integrity. PXI test platforms form a good basis for high throughput functional test systems. This article will discuss test methods and instrument characteristics that will help ensure successful implementation of future test systems.
Improving functional testIn manufacturing, test plans take various forms. A true functional test places the DUT into an electrical environment that emulates the actual application. Connections are loaded and driven as if the DUT was in the final application and the unit is closely observed to verify correct performance.
Unfortunately, a true functional test can be extremely slow and therefore may be impractical in many instances. An alternative test method called DUT-assisted test (DAT) utilizes a communication link to the DUT combined with built-in test commands to isolate and exercise specific portions of the device. This approach yields greater flexibility during the test plan and enables a very fast and efficient testing. Best-in-class manufacturers use DAT methods to achieve high test coverage and a throughput advantage.
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