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TechOnline India > Skip Navigation LinksTest & Measurement
Test & Measurement
NI introduces Multisim 12.0 with editions for circuit design and electronics education
Latest version of the Multisim circuit simulation environment abstracts the complexities of traditional circuit simulation with an intuitive and graphical approach and offers specialized editions for circuit design and electronics education
  • Aeroflex announces new family of low-cost broadband signal analyzers
  • Agilent announces VGA display handheld oscilloscope with two isolated channels
  • Calibrating amplifiers and ADCs in SoCs
  • NI announces test solution for 802.11ac WLAN
  • Managing test code provides flexibility
  • ACE announces ABI testing in Rembrandt release of SuperTest compiler test and validation suite
  • Rapidly expanding test applications drive SMU technology
  • A DIY microcontroller-based functional tester
  • Anritsu introduces PIM Master model for UMTS Band VIII and LTE Band 8 networks
  • National Instruments releases wireless I/O for NI CompactRIO
  • Aeroflex opens subsidiary company in India
  • Jitter and timing analysis in the presence of crosstalk
  • NI India bags F & S tech innovation award
  • Aeroflex launches new digital signal generators, vector signal analyzers
  • Domestic demand for T & M instruments rising: Frost & Sullivan
  • Agilent releases wireless communications test set for R&D
  • NI extends PXI platform with six new product announcements
  • JTAG solution for Teradyne ICTs
  • Agilent expands PXI Digital Multimeter offering with low-cost PXI digital multimeter
  • NI's Measurement Studio 2010 upgrade for more stable test, measurement and control
  • Agilent enhances ENA Option TDR serial interconnect analysis software
  • Tektronix announces mixed domain oscilloscope
  • Essential principles for practical analog BIST
  • Managing signal integrity in tomorrow's high-speed flash-memory-system designs
  • Agilent's handheld digital multimeters simplify daily tasks
  • Optimizing a switch system for mixed signal testing
  • NI introduces PXI Express synchronization module, PXI Express remote controller
  • e-con announces Android BSP for handhelds, industrial applications
  • Tool monitors and captures MCU interfaces
  • Test tools to empower engineers for PCIe 3.0 designs
  • Layout viewer simplifies design/debug process
  • Insertion-loss test system aids PCB fabricators
  • NI blows the lid off VSA performance in PXI form factor
  • JTAG interface cuts entry costs
  • Optimizing functional-test throughout in PXI-based automated test systems
  • Economical, portable oscilloscopes debut with rich feature set
  • IP video surveillance standards
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